Iterative Cluster Harvesting for Wafer Map Defect Patterns.

Alina Pleli Simon Baeuerle Michel Janus Jonas Barth Ralf Mikut Hendrik P. A. Lensch

Published in: CoRR (2024)

Keyphrases

similar patterns
massively parallel
data clustering
clustering algorithm
pattern mining
cluster analysis
maximum a posteriori
pattern discovery
data sets
neural network
digital libraries
data mining techniques
design patterns
integrated circuit
unsupervised clustering