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Application of conformal mapping approximation techniques: parallel conductors of finite dimensions.

Nadine PesonenWalter K. KahnRichard A. AllenMichael W. CresswellMona E. Zaghloul
Published in: IEEE Trans. Instrum. Meas. (2004)
Keyphrases
  • pattern recognition
  • multi view
  • three dimensional
  • high resolution
  • closed form
  • thin film