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Performance evaluation of delay testable enhanced scan flip-flop.

Ashok Kumar SuhagVivek Shrivastava
Published in: Int. J. Syst. Assur. Eng. Manag. (2012)
Keyphrases
  • power dissipation
  • flip flops
  • power consumption
  • low power
  • neural network
  • multiple input
  • low cost
  • digital signal processing
  • cmos technology