Statistical Strategies to Capture Correlation Between Overshooting Effect and Propagation Delay Time in Nano-CMOS Inverters.
Hamed JooypaDaryoosh DidebanHadi HeidariPublished in: IEEE Access (2021)
Keyphrases
- correlation analysis
- statistical analysis
- statistical information
- statistical methods
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- nano scale
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- analog vlsi
- confidence intervals
- low power
- high speed
- neural network
- pose estimation
- parallel processing
- search strategies
- evolutionary algorithm
- computer vision
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- machine learning