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EBSD measurements of elastic strain fields in a GaN/sapphire structure.

J. F. LuoYuan JiT. X. ZhongY. Q. ZhangJ. Z. WangJ. P. LiuN. H. NiuJ. HanX. GuoG. D. Shen
Published in: Microelectron. Reliab. (2006)
Keyphrases
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