C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
EBSD measurements of elastic strain fields in a GaN/sapphire structure.
J. F. Luo
Yuan Ji
T. X. Zhong
Y. Q. Zhang
J. Z. Wang
J. P. Liu
N. H. Niu
J. Han
X. Guo
G. D. Shen
Published in:
Microelectron. Reliab. (2006)
Keyphrases
</>
computer vision
genetic algorithm
data sets
databases
information retrieval
image analysis
image structure
structural properties
graph structure