Development of a Cryogenic System for the Characterization of Advanced CMOS technologies down to 350 mK.
Martínez-R. IsmaelOmar López-LD. FerruscaMiguel VelázquezE. A. Gutiérrez-DDaniel Durini RomeroF. J. De la Hidalga-WPublished in: I2MTC (2021)
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