HV-CV Analysis Trapping Behavior in 650V pGaN HEMT with Field Plates for High-Voltage Power Applications.

Y. S. Lin Cheng Hsun Yang C. H. Wang K. P. Sou Cheng Hong Yang M. C. Shih W. S. Hung W. H. Chuang F. M. Ciou P. C. Chiu C. C. Hsu C. F. Chen D. M. Kuo

Published in: IRPS (2024)

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