HV-CV Analysis Trapping Behavior in 650V pGaN HEMT with Field Plates for High-Voltage Power Applications.
Y. S. LinCheng Hsun YangC. H. WangK. P. SouCheng Hong YangM. C. ShihW. S. HungW. H. ChuangF. M. CiouP. C. ChiuC. C. HsuC. F. ChenD. M. KuoPublished in: IRPS (2024)