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XRD and ToF-SIMS study of intermetallic void formation in Cu-Sn micro-connects.

Glenn RossVesa VuorinenMichael KrauseS. ReissausMatthias PetzoldMervi Paulasto-Kröckel
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • databases
  • neural network
  • empirical studies
  • artificial intelligence
  • high resolution
  • factors affecting
  • data sets
  • computer vision
  • data structure
  • multi agent systems
  • theoretical framework