Explaining the Risk of Infection Spread in Connected Local Regions by a Lattice of SEIR Circuits.

Yukio Ohsawa Teruaki Hayashi

Published in: CoRR (2021)

Keyphrases

data sets
risk factors
connected regions
infectious disease
risk assessment
early warning
image regions
risk management
lattice structure
homogeneous regions
risk measures
immune response
analog vlsi
logic synthesis
minimum risk
logic circuits
high risk
input image
image segmentation
decision making
neural network