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NS3K: A 3-nm Nanosheet FET Standard Cell Library Development and its Impact.

Taehak KimJaehoon JeongSeungmin WooJeonggyu YangHyunwoo KimAhyeon NamChangdong LeeJinmin SeoMinji KimSiwon RyuYoonju OhTaigon Song
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2023)
Keyphrases
  • case study
  • cross platform
  • information technology
  • image analysis
  • real time
  • software engineering
  • rapid development