A Maximum Likelihood Method for Detecting Bad Samples from Illumina BeadChips Data.

Ha Anh Tuan Nguyen Le Sy Vinh Si Quang Le

Published in: KSE (2012)

Keyphrases

data sets
training samples
maximum likelihood
data processing
em algorithm
sample set
statistical methods
data points
statistical analysis
data collection
high dimensional data
support vector machine
knowledge discovery
pairwise
data analysis
cross validation
data acquisition