Login / Signup

Noise properties of thick-film resistors in extended temperature range.

Adam Witold Stadler
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • wide range
  • random noise
  • real time
  • signal to noise ratio
  • structural properties
  • multiscale
  • hidden markov models
  • desirable properties
  • noise removal
  • noise model