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Analysis of the false-positive error rate of tagged fragment marking scheme.

Jinsoo HwangJeankyung KimKichang Kim
Published in: Inf. Process. Lett. (2012)
Keyphrases
  • error rate
  • false positives
  • false negative
  • test set
  • false positive rate
  • detection rate
  • data mining
  • computer vision
  • feature selection
  • pattern recognition