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Off-line analysis of the P300 event-related potential using discrete wavelet transform.

Lukás VarekaPavel Mautner
Published in: TSP (2013)
Keyphrases
  • discrete wavelet transform
  • event related
  • image analysis
  • multiresolution
  • data analysis
  • wavelet coefficients
  • multiscale
  • pattern recognition
  • computational complexity
  • feature space
  • ground truth