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Investigation of Cu ion drift through CVD TiSiN into SiO2 under bias temperature stress conditions.

Takashi KawanoueSeiichi OmotoMasahiko HasunumaTakashi Yoda
Published in: IEICE Electron. Express (2005)
Keyphrases
  • sufficient conditions
  • data sets
  • environmental variables
  • neural network
  • machine learning
  • case study
  • non stationary
  • environmental conditions
  • electric field