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Optimal fault-tolerant quantum comparators for image binarization.

F. OrtsGloria Ortega LópezA. C. CucuraErnestas FilatovasEster M. Garzón
Published in: J. Supercomput. (2021)
Keyphrases
  • fault tolerant
  • fault tolerance
  • image binarization
  • distributed systems
  • load balancing
  • pattern recognition
  • document images
  • optical character recognition
  • euler number