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New Optimized Adaptive Time Series IDS Classifier Algorithm: Beyond Deep Learning.

Saiyed Rasol Bin Tuan MudaMohammad Hafiz Mohd YusofKhaled Mofawiz AlfawazMohammed BalfaqihAbdulrahman Alzahrani
Published in: IEEE Access (2023)
Keyphrases
  • deep learning
  • learning algorithm
  • support vector
  • multi class
  • machine learning
  • decision trees
  • training samples
  • segmentation algorithm
  • test images