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Lines of Comments as a Noteworthy Metric for Analyzing Fault-Proneness in Methods.

Hirohisa AmanSousuke AmasakiTakashi SasakiMinoru Kawahara
Published in: IEICE Trans. Inf. Syst. (2015)
Keyphrases
  • probabilistic model
  • qualitative and quantitative
  • machine learning
  • bayesian networks
  • microarray
  • evaluation metrics
  • metric learning