A Method for Reading a Resistor by Image Processing Techniques.
Yoshihiro MitaniYuuki SugimuraYoshihiko HamamotoPublished in: KES (1) (2008)
Keyphrases
- high precision
- detection method
- experimental study
- dynamic programming
- cost function
- main contribution
- high accuracy
- experimental evaluation
- pairwise
- similarity measure
- mathematical model
- preprocessing
- computational cost
- genetic algorithm
- fully automatic
- synthetic data
- image processing
- support vector machine svm
- statistical model
- image registration
- evaluation method
- optimization algorithm
- segmentation algorithm
- computationally efficient
- support vector machine
- significant improvement
- high dimensional
- objective function
- image sequences
- feature selection