Login / Signup

Layout-Based Soft Error Rate Estimation Framework Considering Multiple Transient Faults - From Device to Circuit Level.

Hsuan-Ming HuangCharles H.-P. Wen
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2016)
Keyphrases
  • error rate
  • equal error rate
  • probabilistic model
  • high speed
  • lower error rates
  • false discovery rate
  • test set
  • estimation error
  • multi class