Yield and Cost Modeling for 3D Chip Stack Technologies.

Patrick P. Mercier S. R. Singh Krzysztof Iniewski Brian Moore P. O'Shea

Published in: CICC (2006)

Keyphrases

low cost
modeling method
high speed
data mining
total cost
analog vlsi
database
data sets
artificial intelligence
st century
modeling language
evolvable hardware