Login / Signup
Noise Investigation in Femtosecond Stimulated Raman Scattering Microscopy.
Rajeev Ranjan
Giovanni Costa
Maria Antonietta Ferrara
Mario Sansone
Luigi Sirleto
Published in:
ICTON (2023)
Keyphrases
</>
image analysis
additive noise
noisy data
multi component
noise level
noisy environments
high throughput
signal to noise ratio
noise model
low snr
database
microscopy images
random noise
image noise
missing data
image sequences
neural network
data sets