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New Method of EMI analysis in power electronics based on semiconductors transient models: Application to SiC MOSFET/Schottky diode.

Slim HriguaFrançois CostaCyrille GautierBertrand Revol
Published in: IECON (2012)
Keyphrases
  • dynamic programming
  • real time
  • learning algorithm
  • theoretical analysis
  • support vector machine svm
  • mathematical model
  • experimental data
  • parallel processing
  • prediction model