Identifying Defects without a priori Knowledge in a Room-Temperature Semiconductor Detector Using Physics Inspired Machine Learning Model.
Srutarshi BanerjeeMiesher RodriguesManuel BallesterAlexander Hans VijaAggelos K. KatsaggelosPublished in: Sensors (2024)
Keyphrases
- machine learning
- computational model
- expert systems
- conceptual model
- high level
- statistical model
- knowledge acquisition
- reasoning process
- formal model
- object detection
- management system
- prior knowledge
- similarity measure
- learning algorithm
- probabilistic model
- domain knowledge
- text classification
- objective function
- mathematical model
- reinforcement learning
- user model
- expert knowledge
- neural network