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An accurate MOSFET aging model for 28 nm integrated circuit simulation.
Bogdan Tudor
Joddy Wang
Zhaoping Chen
Robin Tan
Weidong Liu
Frank Lee
Published in:
Microelectron. Reliab. (2012)
Keyphrases
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integrated circuit
mathematical model
simulation model
high level
probabilistic model
computational model
analytical model
objective function
prior knowledge
low cost
experimental data
simulation environment
simulation models