C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
An accurate MOSFET aging model for 28 nm integrated circuit simulation.
Bogdan Tudor
Joddy Wang
Zhaoping Chen
Robin Tan
Weidong Liu
Frank Lee
Published in:
Microelectron. Reliab. (2012)
Keyphrases
</>
integrated circuit
mathematical model
simulation model
high level
probabilistic model
computational model
analytical model
objective function
prior knowledge
low cost
experimental data
simulation environment
simulation models