Classification from positive and unlabeled data based on likelihood invariance for measurement.
Takeshi YoshidaTakashi WashioTakahito OhshiroMasateru TaniguchiPublished in: Intell. Data Anal. (2021)
Keyphrases
- machine learning
- classification scheme
- decision rules
- automatic classification
- pattern recognition
- support vector machine
- classification method
- classification algorithm
- statistical classification
- classification process
- classification models
- text classification
- support vector
- support vector machine svm
- svm classifier
- classification accuracy
- classification systems
- model selection
- class labels
- image classification
- feature set
- training data
- decision trees
- neural network