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Foreword to the Special Issue on MicroRad 2018.

Sidharth MisraJuha LemmetyinenDara Entekhabi
Published in: IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens. (2019)
Keyphrases
  • special issue
  • international journal
  • ai edam
  • applied intelligence
  • ecml pkdd
  • databases
  • real world
  • petri net