A Deep Learning Based Printing Defect Classification Method with Imbalanced Samples.
Erhu ZhangBo LiPeilin LiYajun ChenPublished in: Symmetry (2019)
Keyphrases
- classification method
- deep learning
- test sample
- unsupervised learning
- knn
- unsupervised feature learning
- machine learning
- k nearest neighbor
- support vector machine svm
- support vector machine
- text classification
- classification algorithm
- data sets
- weakly supervised
- training samples
- mental models
- training set
- multi class
- maximum likelihood
- model selection
- pattern recognition
- real world