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An Analytical Scalable Lumped-Element Model for GaN on Si Inductors.
Mario San Miguel-Montesdeoca
Sergio Mateos-Angulo
Daniel Mayor-Duarte
Javier del Pino
Javier A. García Y. García
Sunil Lalchand Khemchandani
Published in:
IEEE Access (2020)
Keyphrases
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formal model
management system
prediction model
prior knowledge
mathematical model
probabilistic model
object model
database
mathematical morphology
statistical model
theoretical framework
x ray
least squares
cost function
objective function
high level
search engine
neural network
real time