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Degradation mechanisms of AlGaN/GaN HEMTs under 800 MeV Bi ions irradiation.

Zhifeng LeiH. X. GuoM. H. TangC. ZengZhangang ZhangH. ChenY. F. EnY. HuangYiqiang ChenC. Peng
Published in: Microelectron. Reliab. (2018)
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