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Degradation mechanisms of AlGaN/GaN HEMTs under 800 MeV Bi ions irradiation.
Zhifeng Lei
H. X. Guo
M. H. Tang
C. Zeng
Zhangang Zhang
H. Chen
Y. F. En
Y. Huang
Yiqiang Chen
C. Peng
Published in:
Microelectron. Reliab. (2018)
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