Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization.
Nikolaos PapandreouThomas P. ParnellHaralampos PozidisThomas MittelholzerEvangelos EleftheriouCharles CampThomas GriffinGary A. TresslerAndrew WallsPublished in: ACM Trans. Design Autom. Electr. Syst. (2015)