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Fault Coverage on RF VCOs and BIST for Wafer Sort Using Peak-to-Peak Voltage Detectors.

Luca TestaHervé LapuyadeYann DevalJean-Louis CarbonéroJean-Baptiste Begueret
Published in: J. Electron. Test. (2010)
Keyphrases
  • real time
  • data sets
  • genetic algorithm
  • evolutionary algorithm
  • object detection
  • radio frequency