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Operational frequency degradation induced trapping in scaled GaN HEMTs.

Brendan UbochiSoroush FaramehrKhaled AhmedaPetar IgicKarol Kalna
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • low frequency
  • neural network
  • decision making
  • co occurrence
  • information systems
  • feature vectors
  • high frequency
  • decision trees
  • case study
  • structuring elements
  • learning rate