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Improvement of Retention Characteristics Using Doped SiN Layer Between WL Spaces in 3D NAND Flash.

Hyewon KyungYunejae SuhYoungho JungDaewoong Kang
Published in: IEEE Access (2024)
Keyphrases
  • multi layer
  • significant improvement
  • long term
  • information retrieval
  • key features
  • computer vision
  • expert systems