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TCAD Study on Strain Engineering in Vertical Channel Gate-all-around Transistor.

Ran BiBaotong ZhangJianhuan WangJianjun ZhangHaixia LiMing Li
Published in: ASICON (2023)
Keyphrases
  • neural network
  • database
  • experimental study
  • computer aided design
  • information systems
  • high speed
  • simulation study