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Adaptive Bit-Reliability Mapping for LDPCCoded High-Order Modulation Systems.

Hyeong-Gun JooDong-Joon ShinSong-Nam Hong
Published in: VTC Spring (2007)
Keyphrases
  • high order
  • higher order
  • low order
  • tensor analysis
  • fourth order
  • bayesian logistic regression
  • computer vision
  • multiscale
  • machine learning
  • image processing
  • markov random field
  • image quality
  • tensor decomposition