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Automatic mura inspection using the principal component analysis for the TFT-LCD panel.
Jim-Woo Yun
Heon Gu
Dae-Hwan Kim
Hoi-Sik Moon
Sung-Jea Ko
Published in:
ICCE-TW (2014)
Keyphrases
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liquid crystal displays
tft lcd
principal component analysis
thin film transistor
goal programming
face recognition
high resolution
motion blur
supply chain
image formation
thin film
face images
high speed
stock price
higher resolution