Closing the gap between analog and digital testing.

Khaled Saab Naim Ben-Hamida Bozena Kaminska

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2001)

Keyphrases

circuit design
mixed signal
data conversion
printed circuit
delta sigma
analog vlsi
morphological operators
software testing
signal processing
low cost
website
cmos image sensor
neural network
test set
vlsi architecture
digital topology
machine learning