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An Analytical MOS Device Model With Mismatch and Temperature Variation for Subthreshold Circuits.
Ben Varkey Benjamin
Richelle L. Smith
Kwabena A. Boahen
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2023)
Keyphrases
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probabilistic model
theoretical framework
statistical model
multiscale
neural network model
experimental data
cost function
probability distribution
management system
parameter estimation
computational model
mathematical model
formal model
real time
prior knowledge
objective function
social networks