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Influence of AlN buffer layer thickness on the properties of GaN epilayer on Si(1 1 1) by MOCVD.

Weijun LuoXiaoliang WangLunchun GuoHongling XiaoCuimei WangJunxue RanJianping LiJinmin Li
Published in: Microelectron. J. (2008)
Keyphrases
  • structural properties
  • neural network
  • case study
  • application layer
  • database
  • learning algorithm
  • database systems
  • computational complexity
  • multi layer