Direct measurement of transverse mode correlation and MPN using 900nm VCSELs.

Justin Lavrencik Sriharsha Kota Pavan David K. Haupt Stephen E. Ralph

Published in: OFC (2015)

Keyphrases

correlation analysis
data acquisition
highly correlated
correlation coefficient
cross correlation
database
high correlation
measurement data
computer vision
information systems
database systems
face recognition
multiscale
bi directional
cmos technology