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From the Editors of the Special Issue.

Zsófia RuttkayMichael KippAnton NijholtHannes Högni Vilhjálmsson
Published in: Appl. Artif. Intell. (2010)
Keyphrases
  • special issue
  • ai edam
  • ecml pkdd
  • international journal
  • special section
  • applied intelligence
  • neural network
  • machine learning
  • knowledge discovery