Chip warpage model for reliability prediction of delamination failures.
Se Young YangWoon-Seong KwonSoon-Bok LeePublished in: Microelectron. Reliab. (2012)
Keyphrases
- probabilistic model
- formal model
- prediction accuracy
- cost function
- high speed
- computational model
- autoregressive
- objective function
- hybrid model
- probability distribution
- prediction model
- data sets
- model selection
- financial time series
- mathematical model
- regression model
- parameter estimation
- management system
- evolutionary algorithm
- knowledge base
- neural network