The Reliability Improvement Method of Modern Analog Integrated Circuits.
Gegham A. PetrosyanPublished in: EWDTS (2021)
Keyphrases
- detection method
- cost function
- high precision
- experimental evaluation
- integrated circuit
- synthetic data
- theoretical analysis
- decision trees
- optimization algorithm
- support vector machine svm
- classification accuracy
- prior knowledge
- pairwise
- preprocessing
- high accuracy
- computationally efficient
- probabilistic model
- significant improvement
- clustering method
- video camera
- neural network