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Challenges and Opportunities in GaN and ZnO Devices and Materials.
Hadis Morkoç
Jen-Inn Chyi
Alois Krost
Yasushi Nanishi
Donald J. Silversmith
Published in:
Proc. IEEE (2010)
Keyphrases
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mobile devices
lessons learned
real world
technical challenges
thin film
key issues
neural network
machine learning
application scenarios
open issues
wireless technologies
case study
search engine
image analysis
information retrieval
personal computer
smart phones
data mining
emerging technologies