Login / Signup

High-resolution electroencephalographic forward modeling in traumatic brain injury using the finite element method.

S. Y. Matt GohAndrei IrimiaCarinna M. TorgersonRon KikinisPaul M. VespaJohn D. Van Horn
Published in: ISBI (2013)
Keyphrases
  • high resolution
  • traumatic brain injury
  • image processing
  • decision trees
  • remote sensing
  • computer vision
  • high frequency