Development of OLED Panel Defect Detection System through Improved Otsu Algorithm.
Jian GaoZhiliang WangYanyun LiuChuanxia JianXin ChenPublished in: ICIRA (2) (2012)
Keyphrases
- improved algorithm
- learning algorithm
- experimental evaluation
- k means
- detection algorithm
- optimization algorithm
- computational cost
- dynamic programming
- preprocessing
- objective function
- segmentation algorithm
- clustering method
- significant improvement
- cost function
- simulated annealing
- linear programming
- search space
- computationally efficient
- neural network
- recognition algorithm
- energy minimization
- convergence rate
- energy function
- machine learning
- decision trees
- gray level
- theoretical analysis
- particle swarm optimization
- data sets
- np hard
- lower bound