Login / Signup

Application of the Combined Method for the Estimation of the RMS Measurement Error Caused by ADC Nonlinearity.

Andrey N. SerovNikolay A. SerovVladimir D. Glushnev
Published in: MIPRO (2019)
Keyphrases
  • detection method
  • image processing
  • three dimensional
  • object recognition
  • preprocessing
  • pairwise
  • semi supervised
  • measurement error