A Markov chain-based yield formula for VLSI fault-tolerant chips.
Bruno CicianiGiuseppe IazeollaPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1991)
Keyphrases
- markov chain
- fault tolerant
- fault tolerance
- high speed
- steady state
- finite state
- distributed systems
- transition probabilities
- chip design
- markov model
- markov process
- monte carlo method
- monte carlo
- random walk
- transition matrix
- stationary distribution
- state space
- load balancing
- monte carlo simulation
- state machine
- dynamic programming
- safety critical
- search algorithm