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Average-case technology mapping of asynchronous burst-mode circuits.
Wei-Chun Chou
Peter A. Beerel
Kenneth Y. Yun
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
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average case
worst case
worst case analysis
uniform distribution
learning curves
delay insensitive
asynchronous circuits
vc dimension
average case complexity
data sets
reinforcement learning
learning process
pac learning